use midnight_proofs::{circuit::Layouter, plonk::Error};
use crate::{
instructions::{AssertionInstructions, EqualityInstructions},
types::{AssignedBit, InnerConstants},
CircuitField,
};
pub trait ZeroInstructions<F, Assigned>:
AssertionInstructions<F, Assigned> + EqualityInstructions<F, Assigned>
where
F: CircuitField,
Assigned: InnerConstants,
{
fn assert_zero(&self, layouter: &mut impl Layouter<F>, x: &Assigned) -> Result<(), Error> {
self.assert_equal_to_fixed(layouter, x, Assigned::inner_zero())
}
fn assert_non_zero(&self, layouter: &mut impl Layouter<F>, x: &Assigned) -> Result<(), Error> {
self.assert_not_equal_to_fixed(layouter, x, Assigned::inner_zero())
}
fn is_zero(
&self,
layouter: &mut impl Layouter<F>,
x: &Assigned,
) -> Result<AssignedBit<F>, Error> {
self.is_equal_to_fixed(layouter, x, Assigned::inner_zero())
}
}
#[cfg(test)]
pub(crate) mod tests {
use std::marker::PhantomData;
use ff::FromUniformBytes;
use midnight_proofs::{
circuit::{Layouter, SimpleFloorPlanner},
dev::MockProver,
plonk::{Circuit, ConstraintSystem},
};
use rand::SeedableRng;
use rand_chacha::ChaCha8Rng;
use super::*;
use crate::{
instructions::AssignmentInstructions,
testing_utils::{FromScratch, Sampleable},
types::{AssignedNative, InnerValue},
utils::circuit_modeling::{circuit_to_json, cost_measure_end, cost_measure_start},
};
#[derive(Clone, Debug)]
enum Operation {
Assert,
AssertNon,
IsZero,
}
#[derive(Clone, Debug)]
struct TestCircuit<F, Assigned, ZeroChip>
where
Assigned: InnerValue,
{
x: Assigned::Element,
expected: Option<bool>,
operation: Operation,
_marker: PhantomData<(F, Assigned, ZeroChip)>,
}
impl<F, Assigned, ZeroChip> Circuit<F> for TestCircuit<F, Assigned, ZeroChip>
where
F: CircuitField,
Assigned: InnerConstants,
ZeroChip:
ZeroInstructions<F, Assigned> + AssignmentInstructions<F, Assigned> + FromScratch<F>,
{
type Config = <ZeroChip as FromScratch<F>>::Config;
type FloorPlanner = SimpleFloorPlanner;
type Params = ();
fn without_witnesses(&self) -> Self {
unreachable!()
}
fn configure(meta: &mut ConstraintSystem<F>) -> Self::Config {
let committed_instance_column = meta.instance_column();
let instance_column = meta.instance_column();
let constants_column = meta.fixed_column();
meta.enable_constant(constants_column);
ZeroChip::configure_from_scratch(
meta,
&mut vec![],
&mut vec![],
&[committed_instance_column, instance_column],
)
}
fn synthesize(
&self,
config: Self::Config,
mut layouter: impl Layouter<F>,
) -> Result<(), Error> {
let chip = ZeroChip::new_from_scratch(&config);
let x = chip.assign_fixed(&mut layouter, self.x.clone())?;
cost_measure_start(&mut layouter);
match self.operation {
Operation::Assert => chip.assert_zero(&mut layouter, &x),
Operation::AssertNon => chip.assert_non_zero(&mut layouter, &x),
Operation::IsZero => {
let res = chip.is_zero(&mut layouter, &x)?;
let res_as_value: AssignedNative<F> = res.into();
layouter.assign_region(
|| "assert contains fixed",
|mut region| {
region.constrain_constant(
res_as_value.cell(),
if self.expected.unwrap() {
F::ONE
} else {
F::ZERO
},
)
},
)
}
}?;
cost_measure_end(&mut layouter);
chip.load_from_scratch(&mut layouter)
}
}
fn run<F, Assigned, ZeroChip>(
x: &Assigned::Element,
expected: Option<bool>,
operation: Operation,
must_pass: bool,
cost_model: bool,
chip_name: &str,
op_name: &str,
) where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned: InnerConstants,
ZeroChip:
ZeroInstructions<F, Assigned> + AssignmentInstructions<F, Assigned> + FromScratch<F>,
{
let circuit = TestCircuit::<F, Assigned, ZeroChip> {
x: x.clone(),
expected,
operation,
_marker: PhantomData,
};
let public_inputs = vec![vec![], vec![]];
match MockProver::run(&circuit, public_inputs) {
Ok(prover) => match prover.verify() {
Ok(()) => assert!(must_pass),
Err(e) => assert!(!must_pass, "Failed verifier with error {e:?}"),
},
Err(e) => assert!(!must_pass, "Failed prover with error {e:?}"),
}
if cost_model {
circuit_to_json(chip_name, op_name, circuit);
}
}
pub fn test_zero_assertions<F, Assigned, ZeroChip>(name: &str)
where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned: InnerConstants + Sampleable,
ZeroChip:
ZeroInstructions<F, Assigned> + AssignmentInstructions<F, Assigned> + FromScratch<F>,
{
let mut rng = ChaCha8Rng::seed_from_u64(0xc0ffee);
let mut cost_model = true;
[
(Assigned::sample_inner(&mut rng), false),
(Assigned::inner_zero(), true),
(Assigned::inner_one(), false),
]
.into_iter()
.for_each(|(x, is_zero)| {
run::<F, Assigned, ZeroChip>(
&x,
None,
Operation::Assert,
is_zero,
cost_model,
name,
"assert_zero",
);
run::<F, Assigned, ZeroChip>(
&x,
None,
Operation::AssertNon,
!is_zero,
cost_model,
name,
"assert_non_zero",
);
cost_model = false;
});
}
pub fn test_is_zero<F, Assigned, ZeroChip>(name: &str)
where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned: InnerConstants + Sampleable,
ZeroChip:
ZeroInstructions<F, Assigned> + AssignmentInstructions<F, Assigned> + FromScratch<F>,
{
let mut rng = ChaCha8Rng::seed_from_u64(0xc0ffee);
let mut cost_model = true;
[
(Assigned::sample_inner(&mut rng), false),
(Assigned::inner_zero(), true),
(Assigned::inner_one(), false),
]
.into_iter()
.for_each(|(x, expected)| {
run::<F, Assigned, ZeroChip>(
&x,
Some(expected),
Operation::IsZero,
true,
cost_model,
name,
"is_zero",
);
run::<F, Assigned, ZeroChip>(
&x,
Some(!expected),
Operation::IsZero,
false,
false,
"",
"",
);
cost_model = false;
});
}
}