use midnight_proofs::{
circuit::{Layouter, Value},
plonk::Error,
};
use num_bigint::BigUint;
use crate::{types::InnerValue, CircuitField};
pub trait RangeCheckInstructions<F, Assigned>
where
F: CircuitField,
Assigned: InnerValue,
{
fn assign_lower_than_fixed(
&self,
layouter: &mut impl Layouter<F>,
value: Value<Assigned::Element>,
bound: &BigUint,
) -> Result<Assigned, Error>;
fn assert_lower_than_fixed(
&self,
layouter: &mut impl Layouter<F>,
x: &Assigned,
bound: &BigUint,
) -> Result<(), Error>;
}
#[cfg(test)]
pub(crate) mod tests {
use std::{fmt::Debug, marker::PhantomData};
use ff::FromUniformBytes;
use midnight_proofs::{
circuit::{Layouter, SimpleFloorPlanner, Value},
dev::MockProver,
plonk::{Circuit, ConstraintSystem},
};
use rand::{RngCore, SeedableRng};
use rand_chacha::ChaCha8Rng;
use super::*;
use crate::{
instructions::AssignmentInstructions,
testing_utils::FromScratch,
types::InnerConstants,
utils::circuit_modeling::{circuit_to_json, cost_measure_end, cost_measure_start},
};
#[derive(Clone, Debug, Default)]
struct TestCircuit<F, Assigned, Chip>
where
Assigned: InnerValue,
{
x: Assigned::Element,
bound: BigUint,
_marker: PhantomData<(F, Assigned, Chip)>,
}
impl<F, Assigned, Chip> Circuit<F> for TestCircuit<F, Assigned, Chip>
where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned::Element: CircuitField,
Assigned: Clone + Debug + InnerConstants,
Chip: RangeCheckInstructions<F, Assigned>
+ AssignmentInstructions<F, Assigned>
+ FromScratch<F>,
{
type Config = <Chip as FromScratch<F>>::Config;
type FloorPlanner = SimpleFloorPlanner;
type Params = ();
fn without_witnesses(&self) -> Self {
unreachable!()
}
fn configure(meta: &mut ConstraintSystem<F>) -> Self::Config {
let committed_instance_column = meta.instance_column();
let instance_column = meta.instance_column();
Chip::configure_from_scratch(
meta,
&mut vec![],
&mut vec![],
&[committed_instance_column, instance_column],
)
}
fn synthesize(
&self,
config: Self::Config,
mut layouter: impl Layouter<F>,
) -> Result<(), Error> {
let chip = Chip::new_from_scratch(&config);
let x = chip.assign(&mut layouter, Value::known(self.x))?;
cost_measure_start(&mut layouter);
chip.assert_lower_than_fixed(&mut layouter, &x, &self.bound)?;
cost_measure_end(&mut layouter);
chip.load_from_scratch(&mut layouter)
}
}
fn run<F, Assigned, Chip>(
x: Assigned::Element,
bound: BigUint,
must_pass: bool,
cost_model: bool,
chip_name: &str,
op_name: &str,
) where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned::Element: CircuitField,
Assigned: Clone + Debug + InnerConstants,
Chip: RangeCheckInstructions<F, Assigned>
+ AssignmentInstructions<F, Assigned>
+ FromScratch<F>,
{
let circuit = TestCircuit::<F, Assigned, Chip> {
x,
bound,
_marker: PhantomData,
};
let public_inputs = vec![vec![], vec![]];
match MockProver::run(&circuit, public_inputs) {
Ok(prover) => match prover.verify() {
Ok(()) => assert!(must_pass),
Err(e) => assert!(!must_pass, "Failed verifier with error {e:?}"),
},
Err(e) => assert!(!must_pass, "Failed prover with error {e:?}"),
}
if cost_model {
circuit_to_json(chip_name, op_name, circuit);
}
}
pub fn test_assert_lower_than_fixed<F, Assigned, Chip>(name: &str)
where
F: CircuitField + FromUniformBytes<64> + Ord,
Assigned::Element: CircuitField + From<u64>,
Assigned: Clone + Debug + InnerConstants,
Chip: RangeCheckInstructions<F, Assigned>
+ AssignmentInstructions<F, Assigned>
+ FromScratch<F>,
{
let mut rng = ChaCha8Rng::seed_from_u64(0xc0ffee);
let x = rng.next_u64();
let m = u64::MAX;
let mut cost_model = true;
[
(x, m, true),
(m - 1, m, true),
(m, m, false),
(0, 1, true),
(0, 2, true),
(2, 1, false),
(2, 2, false),
(2, 3, true),
(100, 99, false),
(100, 100, false),
(100, 101, true),
((1 << 20) - 1, 1 << 20, true),
(1 << 20, 1 << 20, false),
]
.into_iter()
.for_each(|(x, bound, must_pass)| {
run::<F, Assigned, Chip>(
Assigned::Element::from(x),
BigUint::from(bound),
must_pass,
cost_model,
name,
"assert_lower_than",
);
cost_model = false;
})
}
}