Struct win_sys::Memory::PROCESS_HEAP_ENTRY
source · [−]#[repr(C)]pub struct PROCESS_HEAP_ENTRY {
pub lpData: *mut c_void,
pub cbData: u32,
pub cbOverhead: u8,
pub iRegionIndex: u8,
pub wFlags: u16,
pub Anonymous: PROCESS_HEAP_ENTRY_0,
}Expand description
Required features: ‘Win32_System_Memory’, ‘Win32_Foundation’
Fields
lpData: *mut c_voidcbData: u32cbOverhead: u8iRegionIndex: u8wFlags: u16Anonymous: PROCESS_HEAP_ENTRY_0Trait Implementations
sourceimpl Clone for PROCESS_HEAP_ENTRY
impl Clone for PROCESS_HEAP_ENTRY
sourcepub fn clone(&self) -> PROCESS_HEAP_ENTRY
pub fn clone(&self) -> PROCESS_HEAP_ENTRY
Returns a copy of the value. Read more
1.0.0 · sourcefn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from source. Read more
sourceimpl Default for PROCESS_HEAP_ENTRY
impl Default for PROCESS_HEAP_ENTRY
sourcepub fn default() -> PROCESS_HEAP_ENTRY
pub fn default() -> PROCESS_HEAP_ENTRY
Returns the “default value” for a type. Read more
impl Copy for PROCESS_HEAP_ENTRY
impl Eq for PROCESS_HEAP_ENTRY
Auto Trait Implementations
impl RefUnwindSafe for PROCESS_HEAP_ENTRY
impl !Send for PROCESS_HEAP_ENTRY
impl !Sync for PROCESS_HEAP_ENTRY
impl Unpin for PROCESS_HEAP_ENTRY
impl UnwindSafe for PROCESS_HEAP_ENTRY
Blanket Implementations
sourceimpl<T> BorrowMut<T> for T where
T: ?Sized,
impl<T> BorrowMut<T> for T where
T: ?Sized,
const: unstable · sourcepub fn borrow_mut(&mut self) -> &mut T
pub fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
sourceimpl<T> ToOwned for T where
T: Clone,
impl<T> ToOwned for T where
T: Clone,
type Owned = T
type Owned = T
The resulting type after obtaining ownership.
sourcepub fn to_owned(&self) -> T
pub fn to_owned(&self) -> T
Creates owned data from borrowed data, usually by cloning. Read more
sourcepub fn clone_into(&self, target: &mut T)
pub fn clone_into(&self, target: &mut T)
🔬 This is a nightly-only experimental API. (
toowned_clone_into)Uses borrowed data to replace owned data, usually by cloning. Read more