Struct TechnicalTestParameters 

pub struct TechnicalTestParameters {
    pub source_count: u32,
    pub sample_rate: u32,
    pub buffer_size: u32,
    pub target_platforms: Vec<PlatformType>,
    pub stress_params: StressTestParams,
    pub memory_constraints: MemoryConstraints,
    pub thread_count: u32,
    pub custom_params: HashMap<String, f32>,
}

Technical test parameters

Fields

source_count: u32

Number of concurrent sources

sample_rate: u32

Sample rate for testing

buffer_size: u32

Buffer size

target_platforms: Vec<PlatformType>

Target platforms to test

stress_params: StressTestParams

Stress test parameters

memory_constraints: MemoryConstraints

Memory constraints

thread_count: u32

Thread count for concurrent tests

custom_params: HashMap<String, f32>

Custom parameters

Trait Implementations

impl Clone for TechnicalTestParameters

fn clone(&self) -> TechnicalTestParameters

Returns a duplicate of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for TechnicalTestParameters

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl<'de> Deserialize<'de> for TechnicalTestParameters

fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>

where __D: Deserializer<'de>,

Deserialize this value from the given Serde deserializer.

impl Serialize for TechnicalTestParameters

fn serialize<__S>(&self, __serializer: __S) -> Result<__S::Ok, __S::Error>

where __S: Serializer,

Serialize this value into the given Serde serializer.