pub struct ExponentialTrendBatchRange {
pub exp_rate: (f64, f64, f64),
pub initial_distance: (f64, f64, f64),
pub width_multiplier: (f64, f64, f64),
}Fields§
§exp_rate: (f64, f64, f64)§initial_distance: (f64, f64, f64)§width_multiplier: (f64, f64, f64)Trait Implementations§
Source§impl Clone for ExponentialTrendBatchRange
impl Clone for ExponentialTrendBatchRange
Source§fn clone(&self) -> ExponentialTrendBatchRange
fn clone(&self) -> ExponentialTrendBatchRange
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for ExponentialTrendBatchRange
impl Debug for ExponentialTrendBatchRange
Auto Trait Implementations§
impl Freeze for ExponentialTrendBatchRange
impl RefUnwindSafe for ExponentialTrendBatchRange
impl Send for ExponentialTrendBatchRange
impl Sync for ExponentialTrendBatchRange
impl Unpin for ExponentialTrendBatchRange
impl UnsafeUnpin for ExponentialTrendBatchRange
impl UnwindSafe for ExponentialTrendBatchRange
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
Source§impl<T> CloneToUninit for Twhere
T: Clone,
impl<T> CloneToUninit for Twhere
T: Clone,
Source§impl<T> IntoEither for T
impl<T> IntoEither for T
Source§fn into_either(self, into_left: bool) -> Either<Self, Self>
fn into_either(self, into_left: bool) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left is true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read moreSource§fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left(&self) returns true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read more