Struct TChart 

pub struct TChart {
    pub t_bar: f64,
    pub points: Vec<TChartPoint>,
}

T chart (exponential distribution) result for rare-event monitoring.

Monitors the time between consecutive defect events. Control limits are derived from the exponential distribution percentiles corresponding to ±3σ probability mass (α/2 = 0.00135).

Reference

Borror, C.M., Keats, J.B. & Montgomery, D.C. (2003). “Robustness of the time between events CUSUM”, International Journal of Production Research 41(15), pp. 3435-3444.

Fields

t_bar: f64

Mean inter-event time (t̄).

points: Vec<TChartPoint>

Per-observation chart points.

Trait Implementations

impl Clone for TChart

fn clone(&self) -> TChart

Returns a duplicate of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for TChart

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.