pub struct StackingConfig {
pub cv: usize,
pub use_probabilities: bool,
pub random_state: Option<u64>,
pub passthrough: bool,
}Expand description
Stacking Classifier Configuration
Fields§
§cv: usizeNumber of folds for cross-validation
use_probabilities: boolWhether to use cross-validation predictions as features
random_state: Option<u64>Random seed for cross-validation
passthrough: boolWhether to fit the base estimators on the full dataset
Trait Implementations§
Source§impl Clone for StackingConfig
impl Clone for StackingConfig
Source§fn clone(&self) -> StackingConfig
fn clone(&self) -> StackingConfig
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for StackingConfig
impl Debug for StackingConfig
Auto Trait Implementations§
impl Freeze for StackingConfig
impl RefUnwindSafe for StackingConfig
impl Send for StackingConfig
impl Sync for StackingConfig
impl Unpin for StackingConfig
impl UnwindSafe for StackingConfig
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
Source§impl<T> CloneToUninit for Twhere
T: Clone,
impl<T> CloneToUninit for Twhere
T: Clone,
Source§impl<T> IntoEither for T
impl<T> IntoEither for T
Source§fn into_either(self, into_left: bool) -> Either<Self, Self>
fn into_either(self, into_left: bool) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left is true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read moreSource§fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left(&self) returns true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read more