pub struct NormalizationReport {
pub samples: Vec<f32>,
pub input: LoudnessReport,
pub output: LoudnessReport,
pub requested_gain_db: f64,
pub applied_gain_db: f64,
pub gain_limited: bool,
pub true_peak_ceiling_exceeded: bool,
pub clipped_samples: usize,
}Expand description
Normalized PCM plus fully visible gain, ceiling, and clipping evidence.
Fields§
§samples: Vec<f32>Gain-adjusted float PCM; samples are not clipped or limited.
input: LoudnessReportMeasurement before gain.
output: LoudnessReportMeasurement after the exact applied gain.
requested_gain_db: f64Gain implied by target minus measured integrated loudness.
applied_gain_db: f64Gain actually applied after the explicit gain bound.
gain_limited: boolWhether max_abs_gain_db constrained the requested gain.
true_peak_ceiling_exceeded: boolWhether measured output true peak exceeds the review ceiling.
clipped_samples: usizeOutput float samples outside [-1, 1].
Trait Implementations§
Source§impl Clone for NormalizationReport
impl Clone for NormalizationReport
Source§fn clone(&self) -> NormalizationReport
fn clone(&self) -> NormalizationReport
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for NormalizationReport
impl Debug for NormalizationReport
Source§impl PartialEq for NormalizationReport
impl PartialEq for NormalizationReport
impl StructuralPartialEq for NormalizationReport
Auto Trait Implementations§
impl Freeze for NormalizationReport
impl RefUnwindSafe for NormalizationReport
impl Send for NormalizationReport
impl Sync for NormalizationReport
impl Unpin for NormalizationReport
impl UnsafeUnpin for NormalizationReport
impl UnwindSafe for NormalizationReport
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more