#[repr(C)]pub struct aws_logging_standard_formatting_data {
pub log_line_buffer: *mut c_char,
pub total_length: usize,
pub level: aws_log_level,
pub subject_name: *const c_char,
pub format: *const c_char,
pub date_format: aws_date_format,
pub allocator: *mut aws_allocator,
pub amount_written: usize,
}
Fields
log_line_buffer: *mut c_char
total_length: usize
level: aws_log_level
subject_name: *const c_char
format: *const c_char
date_format: aws_date_format
allocator: *mut aws_allocator
amount_written: usize
Trait Implementations
sourceimpl Clone for aws_logging_standard_formatting_data
impl Clone for aws_logging_standard_formatting_data
sourcefn clone(&self) -> aws_logging_standard_formatting_data
fn clone(&self) -> aws_logging_standard_formatting_data
Returns a copy of the value. Read more
1.0.0 · sourcefn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresourceimpl PartialEq<aws_logging_standard_formatting_data> for aws_logging_standard_formatting_data
impl PartialEq<aws_logging_standard_formatting_data> for aws_logging_standard_formatting_data
sourcefn eq(&self, other: &aws_logging_standard_formatting_data) -> bool
fn eq(&self, other: &aws_logging_standard_formatting_data) -> bool
impl Copy for aws_logging_standard_formatting_data
impl Eq for aws_logging_standard_formatting_data
impl StructuralEq for aws_logging_standard_formatting_data
impl StructuralPartialEq for aws_logging_standard_formatting_data
Auto Trait Implementations
impl RefUnwindSafe for aws_logging_standard_formatting_data
impl !Send for aws_logging_standard_formatting_data
impl !Sync for aws_logging_standard_formatting_data
impl Unpin for aws_logging_standard_formatting_data
impl UnwindSafe for aws_logging_standard_formatting_data
Blanket Implementations
sourceimpl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
const: unstable · sourcefn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more