pub struct GetTrackEventDescriptorResult {
pub descriptor: Binary,
}Fields§
§descriptor: BinaryBase64-encoded serialized perfetto.protos.TrackEventDescriptor protobuf message.
Trait Implementations§
Source§impl Clone for GetTrackEventDescriptorResult
impl Clone for GetTrackEventDescriptorResult
Source§fn clone(&self) -> GetTrackEventDescriptorResult
fn clone(&self) -> GetTrackEventDescriptorResult
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl<'de> Deserialize<'de> for GetTrackEventDescriptorResult
impl<'de> Deserialize<'de> for GetTrackEventDescriptorResult
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Source§impl PartialEq for GetTrackEventDescriptorResult
impl PartialEq for GetTrackEventDescriptorResult
Source§fn eq(&self, other: &GetTrackEventDescriptorResult) -> bool
fn eq(&self, other: &GetTrackEventDescriptorResult) -> bool
Tests for
self and other values to be equal, and is used by ==.Source§impl TryFrom<Value> for GetTrackEventDescriptorResult
impl TryFrom<Value> for GetTrackEventDescriptorResult
impl StructuralPartialEq for GetTrackEventDescriptorResult
Auto Trait Implementations§
impl Freeze for GetTrackEventDescriptorResult
impl RefUnwindSafe for GetTrackEventDescriptorResult
impl Send for GetTrackEventDescriptorResult
impl Sync for GetTrackEventDescriptorResult
impl Unpin for GetTrackEventDescriptorResult
impl UnsafeUnpin for GetTrackEventDescriptorResult
impl UnwindSafe for GetTrackEventDescriptorResult
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more