pub struct TurnStartParams {
pub thread_id: ThreadId,
pub input: Vec<TurnInputItem>,
pub prompt: Option<String>,
pub model_provider: Option<String>,
pub model: Option<String>,
pub reasoning: Option<String>,
pub developer_context: Option<String>,
pub policy_mode: Option<PolicyMode>,
pub task_ledger_required: bool,
}Fields§
§thread_id: ThreadId§input: Vec<TurnInputItem>§prompt: Option<String>§model_provider: Option<String>§model: Option<String>§reasoning: Option<String>§developer_context: Option<String>Per-turn developer-authority context layered after the thread’s developerInstructions for this turn only. Never persisted to thread metadata; absent means no per-turn context.
policy_mode: Option<PolicyMode>§task_ledger_required: boolTrait Implementations§
Source§impl Clone for TurnStartParams
impl Clone for TurnStartParams
Source§fn clone(&self) -> TurnStartParams
fn clone(&self) -> TurnStartParams
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for TurnStartParams
impl Debug for TurnStartParams
Source§impl<'de> Deserialize<'de> for TurnStartParams
impl<'de> Deserialize<'de> for TurnStartParams
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Auto Trait Implementations§
impl Freeze for TurnStartParams
impl RefUnwindSafe for TurnStartParams
impl Send for TurnStartParams
impl Sync for TurnStartParams
impl Unpin for TurnStartParams
impl UnsafeUnpin for TurnStartParams
impl UnwindSafe for TurnStartParams
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more