pub struct ParsedTrack {Show 17 fields
pub styles: Vec<ParsedStyle>,
pub events: Vec<ParsedEvent>,
pub attachments: Vec<ParsedAttachment>,
pub style_format: String,
pub event_format: String,
pub track_type: TrackType,
pub play_res_x: i32,
pub play_res_y: i32,
pub timer: f64,
pub wrap_style: i32,
pub scaled_border_and_shadow: bool,
pub kerning: bool,
pub language: String,
pub ycbcr_matrix: YCbCrMatrix,
pub default_style: i32,
pub layout_res_x: i32,
pub layout_res_y: i32,
}Fields§
§styles: Vec<ParsedStyle>§events: Vec<ParsedEvent>§attachments: Vec<ParsedAttachment>§style_format: String§event_format: String§track_type: TrackType§play_res_x: i32§play_res_y: i32§timer: f64§wrap_style: i32§scaled_border_and_shadow: bool§kerning: bool§language: String§ycbcr_matrix: YCbCrMatrix§default_style: i32§layout_res_x: i32§layout_res_y: i32Trait Implementations§
Source§impl Clone for ParsedTrack
impl Clone for ParsedTrack
Source§fn clone(&self) -> ParsedTrack
fn clone(&self) -> ParsedTrack
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for ParsedTrack
impl Debug for ParsedTrack
Source§impl Default for ParsedTrack
impl Default for ParsedTrack
Source§impl PartialEq for ParsedTrack
impl PartialEq for ParsedTrack
Source§fn eq(&self, other: &ParsedTrack) -> bool
fn eq(&self, other: &ParsedTrack) -> bool
Tests for
self and other values to be equal, and is used by ==.impl StructuralPartialEq for ParsedTrack
Auto Trait Implementations§
impl Freeze for ParsedTrack
impl RefUnwindSafe for ParsedTrack
impl Send for ParsedTrack
impl Sync for ParsedTrack
impl Unpin for ParsedTrack
impl UnsafeUnpin for ParsedTrack
impl UnwindSafe for ParsedTrack
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more