pub struct ArtifactOccurrence {
pub occurrence_id: Option<String>,
pub source_kind: Option<String>,
pub path: Option<String>,
pub line: Option<u32>,
pub column: Option<u32>,
pub context_label: Option<String>,
}Expand description
One place an extracted artifact appeared in the source document.
Fields§
§occurrence_id: Option<String>§source_kind: Option<String>§path: Option<String>§line: Option<u32>§column: Option<u32>§context_label: Option<String>Trait Implementations§
Source§impl Clone for ArtifactOccurrence
impl Clone for ArtifactOccurrence
Source§fn clone(&self) -> ArtifactOccurrence
fn clone(&self) -> ArtifactOccurrence
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for ArtifactOccurrence
impl Debug for ArtifactOccurrence
Source§impl<'de> Deserialize<'de> for ArtifactOccurrence
impl<'de> Deserialize<'de> for ArtifactOccurrence
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
impl Eq for ArtifactOccurrence
Source§impl PartialEq for ArtifactOccurrence
impl PartialEq for ArtifactOccurrence
Source§impl Serialize for ArtifactOccurrence
impl Serialize for ArtifactOccurrence
impl StructuralPartialEq for ArtifactOccurrence
Auto Trait Implementations§
impl Freeze for ArtifactOccurrence
impl RefUnwindSafe for ArtifactOccurrence
impl Send for ArtifactOccurrence
impl Sync for ArtifactOccurrence
impl Unpin for ArtifactOccurrence
impl UnsafeUnpin for ArtifactOccurrence
impl UnwindSafe for ArtifactOccurrence
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more