pub struct PatternPriorCalibrationV0 {
pub schema_version: &'static str,
pub product: &'static str,
pub layer_marker: &'static str,
pub feature_gate: &'static str,
pub corpus_fingerprint: String,
pub calibration_scope: &'static str,
pub axis_a_schema_version: &'static str,
pub fixture_count: usize,
pub generated_at_epoch: u64,
pub human_review_gate_passed: bool,
}Fields§
§schema_version: &'static str§product: &'static str§layer_marker: &'static str§feature_gate: &'static str§corpus_fingerprint: String§calibration_scope: &'static str§axis_a_schema_version: &'static str§fixture_count: usize§generated_at_epoch: u64§human_review_gate_passed: boolTrait Implementations§
Source§impl Clone for PatternPriorCalibrationV0
impl Clone for PatternPriorCalibrationV0
Source§fn clone(&self) -> PatternPriorCalibrationV0
fn clone(&self) -> PatternPriorCalibrationV0
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for PatternPriorCalibrationV0
impl Debug for PatternPriorCalibrationV0
Source§impl PartialEq for PatternPriorCalibrationV0
impl PartialEq for PatternPriorCalibrationV0
Source§fn eq(&self, other: &PatternPriorCalibrationV0) -> bool
fn eq(&self, other: &PatternPriorCalibrationV0) -> bool
Tests for
self and other values to be equal, and is used by ==.impl StructuralPartialEq for PatternPriorCalibrationV0
Auto Trait Implementations§
impl Freeze for PatternPriorCalibrationV0
impl RefUnwindSafe for PatternPriorCalibrationV0
impl Send for PatternPriorCalibrationV0
impl Sync for PatternPriorCalibrationV0
impl Unpin for PatternPriorCalibrationV0
impl UnsafeUnpin for PatternPriorCalibrationV0
impl UnwindSafe for PatternPriorCalibrationV0
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more