pub struct ScalingEvent {
pub time: u64,
pub create_index: u64,
pub count: Option<i64>,
pub previous_count: i64,
pub error: bool,
pub message: String,
pub meta: HashMap<String, Value>,
pub eval_id: Option<String>,
}
Expand description
This struct was generated based on the Go types of the official Nomad API.
Fields§
§time: u64
§create_index: u64
§count: Option<i64>
§previous_count: i64
§error: bool
§message: String
§meta: HashMap<String, Value>
§eval_id: Option<String>
Trait Implementations§
Source§impl Clone for ScalingEvent
impl Clone for ScalingEvent
Source§fn clone(&self) -> ScalingEvent
fn clone(&self) -> ScalingEvent
Returns a copy of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moreSource§impl Debug for ScalingEvent
impl Debug for ScalingEvent
Source§impl Default for ScalingEvent
impl Default for ScalingEvent
Source§fn default() -> ScalingEvent
fn default() -> ScalingEvent
Returns the “default value” for a type. Read more
Source§impl<'de> Deserialize<'de> for ScalingEvent
impl<'de> Deserialize<'de> for ScalingEvent
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Source§impl PartialEq for ScalingEvent
impl PartialEq for ScalingEvent
Source§impl Serialize for ScalingEvent
impl Serialize for ScalingEvent
impl StructuralPartialEq for ScalingEvent
Auto Trait Implementations§
impl Freeze for ScalingEvent
impl RefUnwindSafe for ScalingEvent
impl Send for ScalingEvent
impl Sync for ScalingEvent
impl Unpin for ScalingEvent
impl UnwindSafe for ScalingEvent
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more