Struct minidump_writer::minidump_format::format::IMAGE_DEBUG_MISC
source · pub struct IMAGE_DEBUG_MISC {
pub data_type: u32,
pub length: u32,
pub unicode: u8,
pub reserved: [u8; 3],
pub data: [u8; 1],
}
Expand description
Obsolete debug record type defined in WinNT.h.
Fields§
§data_type: u32
§length: u32
§unicode: u8
§reserved: [u8; 3]
§data: [u8; 1]
Trait Implementations§
source§impl Clone for IMAGE_DEBUG_MISC
impl Clone for IMAGE_DEBUG_MISC
source§fn clone(&self) -> IMAGE_DEBUG_MISC
fn clone(&self) -> IMAGE_DEBUG_MISC
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl Debug for IMAGE_DEBUG_MISC
impl Debug for IMAGE_DEBUG_MISC
source§impl<'a> TryFromCtx<'a, Endian> for IMAGE_DEBUG_MISCwhere
IMAGE_DEBUG_MISC: 'a,
impl<'a> TryFromCtx<'a, Endian> for IMAGE_DEBUG_MISCwhere
IMAGE_DEBUG_MISC: 'a,
type Error = Error
fn try_from_ctx( src: &'a [u8], ctx: Endian ) -> Result<(IMAGE_DEBUG_MISC, usize), <IMAGE_DEBUG_MISC as TryFromCtx<'a, Endian>>::Error>
source§impl<'a> TryIntoCtx<Endian> for &'a IMAGE_DEBUG_MISC
impl<'a> TryIntoCtx<Endian> for &'a IMAGE_DEBUG_MISC
type Error = Error
fn try_into_ctx( self, dst: &mut [u8], ctx: Endian ) -> Result<usize, <&'a IMAGE_DEBUG_MISC as TryIntoCtx<Endian>>::Error>
source§impl TryIntoCtx<Endian> for IMAGE_DEBUG_MISC
impl TryIntoCtx<Endian> for IMAGE_DEBUG_MISC
type Error = Error
fn try_into_ctx( self, dst: &mut [u8], ctx: Endian ) -> Result<usize, <IMAGE_DEBUG_MISC as TryIntoCtx<Endian>>::Error>
Auto Trait Implementations§
impl Freeze for IMAGE_DEBUG_MISC
impl RefUnwindSafe for IMAGE_DEBUG_MISC
impl Send for IMAGE_DEBUG_MISC
impl Sync for IMAGE_DEBUG_MISC
impl Unpin for IMAGE_DEBUG_MISC
impl UnwindSafe for IMAGE_DEBUG_MISC
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more