pub enum ErrorTrend {
Increasing,
Stable,
Decreasing,
}
Expand description
Error trend analysis
Variants§
Trait Implementations§
Source§impl Clone for ErrorTrend
impl Clone for ErrorTrend
Source§fn clone(&self) -> ErrorTrend
fn clone(&self) -> ErrorTrend
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moreSource§impl Debug for ErrorTrend
impl Debug for ErrorTrend
Source§impl PartialEq for ErrorTrend
impl PartialEq for ErrorTrend
impl StructuralPartialEq for ErrorTrend
Auto Trait Implementations§
impl Freeze for ErrorTrend
impl RefUnwindSafe for ErrorTrend
impl Send for ErrorTrend
impl Sync for ErrorTrend
impl Unpin for ErrorTrend
impl UnwindSafe for ErrorTrend
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
Source§impl<T> CloneToUninit for Twhere
T: Clone,
impl<T> CloneToUninit for Twhere
T: Clone,
Source§impl<T> Instrument for T
impl<T> Instrument for T
Source§fn instrument(self, span: Span) -> Instrumented<Self>
fn instrument(self, span: Span) -> Instrumented<Self>
Source§fn in_current_span(self) -> Instrumented<Self>
fn in_current_span(self) -> Instrumented<Self>
Source§impl<T> IntoEither for T
impl<T> IntoEither for T
Source§fn into_either(self, into_left: bool) -> Either<Self, Self>
fn into_either(self, into_left: bool) -> Either<Self, Self>
Converts
self
into a Left
variant of Either<Self, Self>
if into_left
is true
.
Converts self
into a Right
variant of Either<Self, Self>
otherwise. Read moreSource§fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
Converts
self
into a Left
variant of Either<Self, Self>
if into_left(&self)
returns true
.
Converts self
into a Right
variant of Either<Self, Self>
otherwise. Read more