pub struct DeviceRevokeParams {
pub endpoint: String,
pub reason: Option<String>,
}Expand description
Params of Request::DeviceRevoke (#85 ask 4).
Fields§
§endpoint: StringThe eid: principal of the device being revoked — one of THIS person’s own.
Explicit rather than “this node”, because the device you are revoking is usually the one you no longer have: you issue the token from your replacement machine, naming the lost one.
reason: Option<String>Trait Implementations§
Source§impl Clone for DeviceRevokeParams
impl Clone for DeviceRevokeParams
Source§fn clone(&self) -> DeviceRevokeParams
fn clone(&self) -> DeviceRevokeParams
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for DeviceRevokeParams
impl Debug for DeviceRevokeParams
Source§impl<'de> Deserialize<'de> for DeviceRevokeParams
impl<'de> Deserialize<'de> for DeviceRevokeParams
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
impl Eq for DeviceRevokeParams
Source§impl PartialEq for DeviceRevokeParams
impl PartialEq for DeviceRevokeParams
Source§impl Serialize for DeviceRevokeParams
impl Serialize for DeviceRevokeParams
impl StructuralPartialEq for DeviceRevokeParams
Auto Trait Implementations§
impl Freeze for DeviceRevokeParams
impl RefUnwindSafe for DeviceRevokeParams
impl Send for DeviceRevokeParams
impl Sync for DeviceRevokeParams
impl Unpin for DeviceRevokeParams
impl UnsafeUnpin for DeviceRevokeParams
impl UnwindSafe for DeviceRevokeParams
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more