pub struct ExposureParamsDelegate {
pub exposure: <f64 as Delegated>::Delegate,
pub contrast: <f64 as Delegated>::Delegate,
pub offset: <f64 as Delegated>::Delegate,
}Fields§
§exposure: <f64 as Delegated>::Delegate§contrast: <f64 as Delegated>::Delegate§offset: <f64 as Delegated>::DelegateTrait Implementations§
Source§impl Clone for ExposureParamsDelegate
impl Clone for ExposureParamsDelegate
Source§fn clone(&self) -> ExposureParamsDelegate
fn clone(&self) -> ExposureParamsDelegate
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for ExposureParamsDelegate
impl Debug for ExposureParamsDelegate
Source§impl Default for ExposureParamsDelegate
impl Default for ExposureParamsDelegate
Source§impl DelegateEvaluable for ExposureParamsDelegate
impl DelegateEvaluable for ExposureParamsDelegate
type Evaluated = ExposureParams
fn eval( &self, ctx: &DelegateEvalContext<'_>, ) -> Result<Self::Evaluated, LumenError>
Source§impl NodeParams for ExposureParamsDelegate
impl NodeParams for ExposureParamsDelegate
type Evaluated = ExposureParams
fn property_defs() -> Vec<PropertyDef>
fn is_property(id: &str) -> bool
fn default_properties(&self) -> Vec<(&'static str, PropertyValue)>
fn get_property(&self, id: &str) -> Option<PropertyExpression>
fn eval( &self, ctx: &NodeParamEvalContext<'_>, ) -> Result<Self::Evaluated, LumenError>
Auto Trait Implementations§
impl Freeze for ExposureParamsDelegate
impl RefUnwindSafe for ExposureParamsDelegate
impl Send for ExposureParamsDelegate
impl Sync for ExposureParamsDelegate
impl Unpin for ExposureParamsDelegate
impl UnsafeUnpin for ExposureParamsDelegate
impl UnwindSafe for ExposureParamsDelegate
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more