Struct linux_perf_data::Feature
source · pub struct Feature(pub u32);Expand description
A piece of optional data stored in a perf.data file. Its data is contained in a “feature section” at the end of the file.
For each used feature, a bit is set in the feature flags in the file header. The feature sections are stored just after the file’s data section; there’s one section for each enabled feature, ordered from low feature bit to high feature bit.
Tuple Fields§
§0: u32Implementations§
source§impl Feature
impl Feature
pub const TRACING_DATA: Self = _
pub const BUILD_ID: Self = _
pub const HOSTNAME: Self = _
pub const OSRELEASE: Self = _
pub const VERSION: Self = _
pub const ARCH: Self = _
pub const NRCPUS: Self = _
pub const CPUDESC: Self = _
pub const CPUID: Self = _
pub const TOTAL_MEM: Self = _
pub const CMDLINE: Self = _
pub const EVENT_DESC: Self = _
pub const CPU_TOPOLOGY: Self = _
pub const NUMA_TOPOLOGY: Self = _
pub const BRANCH_STACK: Self = _
pub const PMU_MAPPINGS: Self = _
pub const GROUP_DESC: Self = _
pub const AUXTRACE: Self = _
pub const STAT: Self = _
pub const CACHE: Self = _
pub const SAMPLE_TIME: Self = _
pub const SAMPLE_TOPOLOGY: Self = _
pub const CLOCKID: Self = _
pub const DIR_FORMAT: Self = _
pub const BPF_PROG_INFO: Self = _
pub const BPF_BTF: Self = _
pub const COMPRESSED: Self = _
pub const CPU_PMU_CAPS: Self = _
pub const CLOCK_DATA: Self = _
pub const HYBRID_TOPOLOGY: Self = _
pub const HYBRID_CPU_PMU_CAPS: Self = _
pub const SIMPLEPERF_META_INFO: Self = _
pub const SIMPLEPERF_DEBUG_UNWIND: Self = _
pub const SIMPLEPERF_DEBUG_UNWIND_FILE: Self = _
pub const SIMPLEPERF_FILE2: Self = _
Trait Implementations§
source§impl Ord for Feature
impl Ord for Feature
source§impl PartialEq<Feature> for Feature
impl PartialEq<Feature> for Feature
source§impl PartialOrd<Feature> for Feature
impl PartialOrd<Feature> for Feature
1.0.0 · source§fn le(&self, other: &Rhs) -> bool
fn le(&self, other: &Rhs) -> bool
This method tests less than or equal to (for
self and other) and is used by the <=
operator. Read more