Struct libduckdb_sys::__last_branch_record
source · [−]#[repr(C)]pub struct __last_branch_record {
pub __from_ip: __uint64_t,
pub __to_ip: __uint64_t,
pub _bitfield_align_1: [u16; 0],
pub _bitfield_1: __BindgenBitfieldUnit<[u8; 4]>,
pub __bindgen_padding_0: u32,
}Fields
__from_ip: __uint64_t__to_ip: __uint64_t_bitfield_align_1: [u16; 0]_bitfield_1: __BindgenBitfieldUnit<[u8; 4]>__bindgen_padding_0: u32Implementations
sourceimpl __last_branch_record
impl __last_branch_record
pub fn __mispredict(&self) -> __uint32_t
pub fn set___mispredict(&mut self, val: __uint32_t)
pub fn __tsx_abort(&self) -> __uint32_t
pub fn set___tsx_abort(&mut self, val: __uint32_t)
pub fn __in_tsx(&self) -> __uint32_t
pub fn set___in_tsx(&mut self, val: __uint32_t)
pub fn __cycle_count(&self) -> __uint32_t
pub fn set___cycle_count(&mut self, val: __uint32_t)
pub fn __reserved(&self) -> __uint32_t
pub fn set___reserved(&mut self, val: __uint32_t)
pub fn new_bitfield_1(
__mispredict: __uint32_t,
__tsx_abort: __uint32_t,
__in_tsx: __uint32_t,
__cycle_count: __uint32_t,
__reserved: __uint32_t
) -> __BindgenBitfieldUnit<[u8; 4]>
Trait Implementations
sourceimpl Clone for __last_branch_record
impl Clone for __last_branch_record
sourcefn clone(&self) -> __last_branch_record
fn clone(&self) -> __last_branch_record
Returns a copy of the value. Read more
1.0.0 · sourcefn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moresourceimpl Debug for __last_branch_record
impl Debug for __last_branch_record
impl Copy for __last_branch_record
Auto Trait Implementations
impl RefUnwindSafe for __last_branch_record
impl Send for __last_branch_record
impl Sync for __last_branch_record
impl Unpin for __last_branch_record
impl UnwindSafe for __last_branch_record
Blanket Implementations
sourceimpl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
const: unstable · sourcefn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more