pub struct AppliedPatch {
pub file: Utf8PathBuf,
pub start_line: u32,
pub end_line: u32,
pub replaced_text: String,
}Expand description
Audit record of one applied span.
Fields§
§file: Utf8PathBufFile that was edited, relative to the workspace root.
start_line: u32One-based first line replaced.
end_line: u32One-based last line replaced.
replaced_text: StringThe text that was replaced, for reversibility and logging.
Trait Implementations§
Source§impl Clone for AppliedPatch
impl Clone for AppliedPatch
Source§fn clone(&self) -> AppliedPatch
fn clone(&self) -> AppliedPatch
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for AppliedPatch
impl Debug for AppliedPatch
Source§impl<'de> Deserialize<'de> for AppliedPatch
impl<'de> Deserialize<'de> for AppliedPatch
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
impl Eq for AppliedPatch
Source§impl PartialEq for AppliedPatch
impl PartialEq for AppliedPatch
Source§fn eq(&self, other: &AppliedPatch) -> bool
fn eq(&self, other: &AppliedPatch) -> bool
Tests for
self and other values to be equal, and is used by ==.Source§impl Serialize for AppliedPatch
impl Serialize for AppliedPatch
impl StructuralPartialEq for AppliedPatch
Auto Trait Implementations§
impl Freeze for AppliedPatch
impl RefUnwindSafe for AppliedPatch
impl Send for AppliedPatch
impl Sync for AppliedPatch
impl Unpin for AppliedPatch
impl UnsafeUnpin for AppliedPatch
impl UnwindSafe for AppliedPatch
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more