pub struct SurfaceValidity {
pub strike_tolerance: f64,
pub maturity_tolerance_years: f64,
}Expand description
How far outside the quoted grid the surface still answers.
Fields§
§strike_tolerance: f64Multiples of the quoted strike range that may be exceeded on either side. 0.0 refuses
any strike outside the grid, f64::INFINITY never refuses.
maturity_tolerance_years: f64Years beyond the last quoted maturity that may still be asked for.
Trait Implementations§
Source§impl Clone for SurfaceValidity
impl Clone for SurfaceValidity
Source§fn clone(&self) -> SurfaceValidity
fn clone(&self) -> SurfaceValidity
Returns a duplicate of the value. Read more
1.0.0 (const: unstable) · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreimpl Copy for SurfaceValidity
Source§impl Debug for SurfaceValidity
impl Debug for SurfaceValidity
Source§impl Default for SurfaceValidity
impl Default for SurfaceValidity
Source§impl<'de> Deserialize<'de> for SurfaceValidity
impl<'de> Deserialize<'de> for SurfaceValidity
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Source§impl PartialEq for SurfaceValidity
impl PartialEq for SurfaceValidity
Source§impl Serialize for SurfaceValidity
impl Serialize for SurfaceValidity
impl StructuralPartialEq for SurfaceValidity
Auto Trait Implementations§
impl Freeze for SurfaceValidity
impl RefUnwindSafe for SurfaceValidity
impl Send for SurfaceValidity
impl Sync for SurfaceValidity
impl Unpin for SurfaceValidity
impl UnsafeUnpin for SurfaceValidity
impl UnwindSafe for SurfaceValidity
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more