#[non_exhaustive]pub struct RerankUsage {
pub search_units: Option<i64>,
pub total_tokens: Option<i64>,
pub cost: Option<Number>,
pub rest: Rest,
}Fields (Non-exhaustive)§
This struct is marked as non-exhaustive
Non-exhaustive structs could have additional fields added in future. Therefore, non-exhaustive structs cannot be constructed in external crates using the traditional
Struct { .. } syntax; cannot be matched against without a wildcard ..; and struct update syntax will not work.search_units: Option<i64>§total_tokens: Option<i64>§cost: Option<Number>§rest: RestImplementations§
Source§impl RerankUsage
impl RerankUsage
Sourcepub fn builder() -> RerankUsageBuilder
pub fn builder() -> RerankUsageBuilder
Start a builder by supplying the required fields in declaration order.
Trait Implementations§
Source§impl Clone for RerankUsage
impl Clone for RerankUsage
Source§impl Debug for RerankUsage
impl Debug for RerankUsage
Source§impl DeclaredFields for RerankUsage
impl DeclaredFields for RerankUsage
fn into_declared(self) -> Self
Source§impl<'de> Deserialize<'de> for RerankUsage
impl<'de> Deserialize<'de> for RerankUsage
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Source§impl PartialEq for RerankUsage
impl PartialEq for RerankUsage
Source§impl Serialize for RerankUsage
impl Serialize for RerankUsage
impl StructuralPartialEq for RerankUsage
Auto Trait Implementations§
impl Freeze for RerankUsage
impl RefUnwindSafe for RerankUsage
impl Send for RerankUsage
impl Sync for RerankUsage
impl Unpin for RerankUsage
impl UnsafeUnpin for RerankUsage
impl UnwindSafe for RerankUsage
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more