Module esp32s3::usb_device::test

USB Internal PHY test register

Structs

• TEST_SPEC
  USB Internal PHY test register

Type Aliases

• ENABLE_R
  Field ENABLE reader - Enable test of the USB pad
• ENABLE_W
  Field ENABLE writer - Enable test of the USB pad
• R
  Register TEST reader
• RX_DM_R
  Field RX_DM reader - USB D- rx value in test
• RX_DP_R
  Field RX_DP reader - USB D+ rx value in test
• RX_RCV_R
  Field RX_RCV reader - USB differential rx value in test
• TX_DM_R
  Field TX_DM reader - USB D- tx value in test
• TX_DM_W
  Field TX_DM writer - USB D- tx value in test
• TX_DP_R
  Field TX_DP reader - USB D+ tx value in test
• TX_DP_W
  Field TX_DP writer - USB D+ tx value in test
• USB_OE_R
  Field USB_OE reader - USB pad oen in test
• USB_OE_W
  Field USB_OE writer - USB pad oen in test
• W
  Register TEST writer