Expand description
USB Internal PHY test register
Structs§
- TEST_
SPEC - USB Internal PHY test register
Type Aliases§
- ENABLE_
R - Field
ENABLE
reader - Enable test of the USB pad - ENABLE_
W - Field
ENABLE
writer - Enable test of the USB pad - R
- Register
TEST
reader - RX_DM_R
- Field
RX_DM
reader - USB D- rx value in test - RX_DP_R
- Field
RX_DP
reader - USB D+ rx value in test - RX_
RCV_ R - Field
RX_RCV
reader - USB differential rx value in test - TX_DM_R
- Field
TX_DM
reader - USB D- tx value in test - TX_DM_W
- Field
TX_DM
writer - USB D- tx value in test - TX_DP_R
- Field
TX_DP
reader - USB D+ tx value in test - TX_DP_W
- Field
TX_DP
writer - USB D+ tx value in test - USB_
OE_ R - Field
USB_OE
reader - USB pad oen in test - USB_
OE_ W - Field
USB_OE
writer - USB pad oen in test - W
- Register
TEST
writer