Struct esp32s3::usb_device::test::R

pub struct R(_);

Register TEST reader

Implementations

impl R

pub fn enable(&self) -> ENABLE_R

Bit 0 - Enable test of the USB pad

pub fn usb_oe(&self) -> USB_OE_R

Bit 1 - USB pad oen in test

pub fn tx_dp(&self) -> TX_DP_R

Bit 2 - USB D+ tx value in test

pub fn tx_dm(&self) -> TX_DM_R

Bit 3 - USB D- tx value in test

pub fn rx_rcv(&self) -> RX_RCV_R

Bit 4 - USB differential rx value in test

pub fn rx_dp(&self) -> RX_DP_R

Bit 5 - USB D+ rx value in test

pub fn rx_dm(&self) -> RX_DM_R

Bit 6 - USB D- rx value in test

Methods from Deref<Target = R<TEST_SPEC>>

pub fn bits(&self) -> REG::Ux

Reads raw bits from register.

Trait Implementations

impl Deref for R

type Target = R<TEST_SPEC>

The resulting type after dereferencing.

fn deref(&self) -> &Self::Target

Dereferences the value.

impl From<R<TEST_SPEC>> for R

fn from(reader: R<TEST_SPEC>) -> Self

Converts to this type from the input type.