Struct esp32s3_hal::pac::usb_wrap::test_conf::R

pub struct R(_);

Register TEST_CONF reader

Implementations

impl R

pub fn test_enable(&self) -> BitReaderRaw<bool>

Bit 0 - Enable test of the USB pad

pub fn test_usb_oe(&self) -> BitReaderRaw<bool>

Bit 1 - USB pad oen in test

pub fn test_tx_dp(&self) -> BitReaderRaw<bool>

Bit 2 - USB D+ tx value in test

pub fn test_tx_dm(&self) -> BitReaderRaw<bool>

Bit 3 - USB D- tx value in test

pub fn test_rx_rcv(&self) -> BitReaderRaw<bool>

Bit 4 - USB differential rx value in test

pub fn test_rx_dp(&self) -> BitReaderRaw<bool>

Bit 5 - USB D+ rx value in test

pub fn test_rx_dm(&self) -> BitReaderRaw<bool>

Bit 6 - USB D- rx value in test

Methods from Deref<Target = R<TEST_CONF_SPEC>>

pub fn bits(&self) -> <REG as RegisterSpec>::Ux

Reads raw bits from register.

Trait Implementations

impl Deref for R

type Target = R<TEST_CONF_SPEC>

The resulting type after dereferencing.

fn deref(&self) -> &<R as Deref>::Target

Dereferences the value.

impl From<R<TEST_CONF_SPEC>> for R

fn from(reader: R<TEST_CONF_SPEC>) -> R

Converts to this type from the input type.