Struct esp32s3_hal::pac::usb_device::test::W

pub struct W(_);

Register TEST writer

Implementations

impl W

pub fn enable(&mut self) -> BitWriterRaw<'_, u32, TEST_SPEC, bool, BitM, 0>

Bit 0 - Enable test of the USB pad

pub fn usb_oe(&mut self) -> BitWriterRaw<'_, u32, TEST_SPEC, bool, BitM, 1>

Bit 1 - USB pad oen in test

pub fn tx_dp(&mut self) -> BitWriterRaw<'_, u32, TEST_SPEC, bool, BitM, 2>

Bit 2 - USB D+ tx value in test

pub fn tx_dm(&mut self) -> BitWriterRaw<'_, u32, TEST_SPEC, bool, BitM, 3>

Bit 3 - USB D- tx value in test

pub unsafe fn bits(&mut self, bits: u32) -> &mut W

Writes raw bits to the register.

Methods from Deref<Target = W<TEST_SPEC>>

pub unsafe fn bits(&mut self, bits: <REG as RegisterSpec>::Ux) -> &mut W<REG>

Writes raw bits to the register.

Safety

Read datasheet or reference manual to find what values are allowed to pass.

Trait Implementations

impl Deref for W

type Target = W<TEST_SPEC>

The resulting type after dereferencing.

fn deref(&self) -> &<W as Deref>::Target

Dereferences the value.

impl DerefMut for W

fn deref_mut(&mut self) -> &mut <W as Deref>::Target

Mutably dereferences the value.

impl From<W<TEST_SPEC>> for W

fn from(writer: W<TEST_SPEC>) -> W

Converts to this type from the input type.