Struct esp32c6::usb_device::test::W

pub struct W(_);

Register TEST writer

Implementations

impl W

pub fn test_enable(&mut self) -> TEST_ENABLE_W<'_, 0>

Bit 0 - Enable test of the USB pad

pub fn test_usb_oe(&mut self) -> TEST_USB_OE_W<'_, 1>

Bit 1 - USB pad oen in test

pub fn test_tx_dp(&mut self) -> TEST_TX_DP_W<'_, 2>

Bit 2 - USB D+ tx value in test

pub fn test_tx_dm(&mut self) -> TEST_TX_DM_W<'_, 3>

Bit 3 - USB D- tx value in test

pub unsafe fn bits(&mut self, bits: u32) -> &mut Self

Writes raw bits to the register.

Methods from Deref<Target = W<TEST_SPEC>>

pub unsafe fn bits(&mut self, bits: REG::Ux) -> &mut Self

Writes raw bits to the register.

Safety

Read datasheet or reference manual to find what values are allowed to pass.

Trait Implementations

impl Deref for W

type Target = W<TEST_SPEC>

The resulting type after dereferencing.

fn deref(&self) -> &Self::Target

Dereferences the value.

impl DerefMut for W

fn deref_mut(&mut self) -> &mut Self::Target

Mutably dereferences the value.

impl From<W<TEST_SPEC>> for W

fn from(writer: W<TEST_SPEC>) -> Self

Converts to this type from the input type.