Struct esp32c3::usb_device::test::TEST_SPEC

pub struct TEST_SPEC;

USB_DEVICE_TEST_REG.

This register you can read, write_with_zero, reset, write, modify. See API.

For information about available fields see test module

Trait Implementations

impl Readable for TEST_SPEC

read() method returns test::R reader structure

type Reader = R

Result from a call to read and argument to modify.

impl RegisterSpec for TEST_SPEC

type Ux = u32

Raw register type (u8, u16, u32, …).

impl Resettable for TEST_SPEC

reset() method sets TEST to value 0

const RESET_VALUE: Self::Ux = {transmute(0x00000000): <usb_device::test::TEST_SPEC as generic::RegisterSpec>::Ux}

Reset value of the register.

fn reset_value() -> Self::Ux

Reset value of the register.

impl Writable for TEST_SPEC

write(|w| ..) method takes test::W writer structure

type Writer = W

Writer type argument to write, et al.

const ZERO_TO_MODIFY_FIELDS_BITMAP: Self::Ux = {transmute(0x00000000): <usb_device::test::TEST_SPEC as generic::RegisterSpec>::Ux}

Specifies the register bits that are not changed if you pass 1 and are changed if you pass 0

const ONE_TO_MODIFY_FIELDS_BITMAP: Self::Ux = {transmute(0x00000000): <usb_device::test::TEST_SPEC as generic::RegisterSpec>::Ux}

Specifies the register bits that are not changed if you pass 0 and are changed if you pass 1