#[repr(C)]pub struct _tagEOS_Connect_LoginOptions {
pub ApiVersion: i32,
pub Credentials: *const EOS_Connect_Credentials,
pub UserLoginInfo: *const EOS_Connect_UserLoginInfo,
}Expand description
Input parameters for the EOS_Connect_Login function.
Fields§
§ApiVersion: i32API Version: Set this to EOS_CONNECT_LOGIN_API_LATEST.
Credentials: *const EOS_Connect_CredentialsCredentials specified for a given login method
UserLoginInfo: *const EOS_Connect_UserLoginInfoAdditional information about the local user.
This field is required to be set and used when authenticating the user using Amazon, Apple, Google, Nintendo Account, Nintendo Service Account, Oculus or the Device ID feature login. It is also required for using the Lobbies and Sessions interfaces when running on the Nintendo Switch device, and using any other credential type than EOS_ECT_NINTENDO_NSA_ID_TOKEN. In all other cases, set this field to NULL.
Trait Implementations§
Source§impl Clone for _tagEOS_Connect_LoginOptions
impl Clone for _tagEOS_Connect_LoginOptions
Source§fn clone(&self) -> _tagEOS_Connect_LoginOptions
fn clone(&self) -> _tagEOS_Connect_LoginOptions
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for _tagEOS_Connect_LoginOptions
impl Debug for _tagEOS_Connect_LoginOptions
impl Copy for _tagEOS_Connect_LoginOptions
Auto Trait Implementations§
impl Freeze for _tagEOS_Connect_LoginOptions
impl RefUnwindSafe for _tagEOS_Connect_LoginOptions
impl !Send for _tagEOS_Connect_LoginOptions
impl !Sync for _tagEOS_Connect_LoginOptions
impl Unpin for _tagEOS_Connect_LoginOptions
impl UnsafeUnpin for _tagEOS_Connect_LoginOptions
impl UnwindSafe for _tagEOS_Connect_LoginOptions
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more