pub struct UsageSnapshot {
pub execution_id: String,
pub tenant_id: String,
pub steps: u32,
pub input_tokens: u32,
pub output_tokens: u32,
pub total_tokens: u32,
pub wall_time_ms: u64,
pub discovered_steps: u32,
pub discovery_depth: u32,
pub max_discovery_depth: u32,
pub cost_usd: f64,
}Expand description
Serializable snapshot of execution usage
Fields§
§execution_id: String§tenant_id: String§steps: u32§input_tokens: u32§output_tokens: u32§total_tokens: u32§wall_time_ms: u64§discovered_steps: u32§discovery_depth: u32§max_discovery_depth: u32§cost_usd: f64Trait Implementations§
Source§impl Clone for UsageSnapshot
impl Clone for UsageSnapshot
Source§fn clone(&self) -> UsageSnapshot
fn clone(&self) -> UsageSnapshot
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for UsageSnapshot
impl Debug for UsageSnapshot
Source§impl<'de> Deserialize<'de> for UsageSnapshot
impl<'de> Deserialize<'de> for UsageSnapshot
Source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
Source§impl From<&ExecutionUsage> for UsageSnapshot
impl From<&ExecutionUsage> for UsageSnapshot
Source§fn from(usage: &ExecutionUsage) -> Self
fn from(usage: &ExecutionUsage) -> Self
Converts to this type from the input type.
Auto Trait Implementations§
impl Freeze for UsageSnapshot
impl RefUnwindSafe for UsageSnapshot
impl Send for UsageSnapshot
impl Sync for UsageSnapshot
impl Unpin for UsageSnapshot
impl UnsafeUnpin for UsageSnapshot
impl UnwindSafe for UsageSnapshot
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more