Struct MockFlash 

pub struct MockFlash<const SIZE: usize> { /* private fields */ }

Simple mock flash device with byte-level operations

Simulates EEPROM-like flash where individual bytes can be written. Initialized with all bytes set to 0xFF (erased state).

Implementations

impl<const SIZE: usize> MockFlash<SIZE>

pub const fn new() -> Self

Trait Implementations

impl<const SIZE: usize> Debug for MockFlash<SIZE>

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl<const SIZE: usize> Default for MockFlash<SIZE>

fn default() -> Self

Returns the “default value” for a type.

impl<const SIZE: usize> Flash for MockFlash<SIZE>

type Error = Infallible

The error type for flash operations

fn read(&mut self, addr: u32, buf: &mut [u8]) -> Result<(), Self::Error>

Read data from flash memory at the specified byte address

fn write(&mut self, addr: u32, data: &mut [u8]) -> Result<(), Self::Error>

Write data to flash memory at the specified address

fn erase(&mut self, addr: u32) -> Result<(), Self::Error>

Erase a flash sector or replace first byte to invalidate a slot

fn erase_all(&mut self, count: usize) -> Result<(), Self::Error>

Bulk erase multiple slots/sectors

impl<const SIZE: usize> PartialEq for MockFlash<SIZE>

fn eq(&self, other: &MockFlash<SIZE>) -> bool

Tests for self and other values to be equal, and is used by ==.

fn ne(&self, other: &Rhs) -> bool

Tests for !=. The default implementation is almost always sufficient, and should not be overridden without very good reason.

impl<const SIZE: usize> StructuralPartialEq for MockFlash<SIZE>