Struct embedded_hal::digital::v1_compat::OldInputPin

pub struct OldInputPin<T> { /* fields omitted */ }

Wrapper to allow fallible v2::InputPin traits to be converted to v1::InputPin traits where errors will panic.

Implementations

impl<T, E> OldInputPin<T> where
    T: InputPin<Error = E>,
    E: Debug, 

pub fn new(pin: T) -> Self

Create an OldInputPin wrapper around a v2::InputPin.

Trait Implementations

impl<T, E> From<T> for OldInputPin<T> where
    T: InputPin<Error = E>,
    E: Debug, 

fn from(pin: T) -> Self

Performs the conversion.

impl<T, E> InputPin for OldInputPin<T> where
    T: InputPin<Error = E>,
    E: Debug, 

Implementation of v1::InputPin trait for v2::InputPin fallible pins where errors will panic.

fn is_low(&self) -> bool

👎 Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Is the input pin low?

fn is_high(&self) -> bool

👎 Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Is the input pin high?