Struct embedded_hal::digital::v1_compat::OldOutputPin

pub struct OldOutputPin<T> { /* fields omitted */ }

Wrapper to allow fallible v2::OutputPin traits to be converted to v1::OutputPin traits

Methods

impl<T, E> OldOutputPin<T> where
    T: OutputPin<Error = E>,
    E: Debug, 

pub fn new(pin: T) -> Self

Create a new OldOutputPin wrapper around a v2::OutputPin

Trait Implementations

impl<T, E> OutputPin for OldOutputPin<T> where
    T: OutputPin<Error = E>,
    E: Debug, 

Implementation of v1::OutputPin trait for fallible v2::OutputPin output pins where errors will panic.

fn set_low(&mut self)

Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Drives the pin low

fn set_high(&mut self)

Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Drives the pin high

impl<T, E> StatefulOutputPin for OldOutputPin<T> where
    T: StatefulOutputPin<Error = E>,
    E: Debug, 

Implementation of v1::StatefulOutputPin trait for v2::StatefulOutputPin fallible pins where errors will panic.

fn is_set_low(&self) -> bool

Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Is the pin in drive low mode?

fn is_set_high(&self) -> bool

Deprecated since 0.2.2:

Deprecated because the methods cannot return errors. Users should use the traits in digital::v2.

Is the pin in drive high mode?

impl<T, E> From<T> for OldOutputPin<T> where
    T: OutputPin<Error = E>,
    E: Debug, 

fn from(pin: T) -> Self

Performs the conversion.