pub struct DeviceErrors {
pub invalid_register_write: bool,
pub invalid_register_read: bool,
pub invalid_measurement: bool,
pub max_resistance: bool,
pub heater_fault: bool,
pub heater_supply: bool,
}
Expand description
Errors reported by the device.
Fields§
§invalid_register_write: bool
I2C write to an invalid register reported by device.
invalid_register_read: bool
I2C read from an invalid register reported by device.
invalid_measurement: bool
Invalid measurement reported by device.
max_resistance: bool
Sensor resistance measurement reached or exceeded the maximum range reported by device.
heater_fault: bool
Heater current not in range reported by device.
heater_supply: bool
Heater current not applied correctly reported by device.
Trait Implementations§
Source§impl Clone for DeviceErrors
impl Clone for DeviceErrors
Source§fn clone(&self) -> DeviceErrors
fn clone(&self) -> DeviceErrors
Returns a copy of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moreSource§impl Debug for DeviceErrors
impl Debug for DeviceErrors
Source§impl Default for DeviceErrors
impl Default for DeviceErrors
Source§fn default() -> DeviceErrors
fn default() -> DeviceErrors
Returns the “default value” for a type. Read more
Source§impl PartialEq for DeviceErrors
impl PartialEq for DeviceErrors
impl Copy for DeviceErrors
impl StructuralPartialEq for DeviceErrors
Auto Trait Implementations§
impl Freeze for DeviceErrors
impl RefUnwindSafe for DeviceErrors
impl Send for DeviceErrors
impl Sync for DeviceErrors
impl Unpin for DeviceErrors
impl UnwindSafe for DeviceErrors
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more