Struct aws_sdk_devicefarm::operation::get_test::GetTestInput

#[non_exhaustive]
pub struct GetTestInput {
    pub arn: Option<String>,
}

Represents a request to the get test operation.

Fields (Non-exhaustive)

Non-exhaustive structs could have additional fields added in future. Therefore, non-exhaustive structs cannot be constructed in external crates using the traditional Struct { .. } syntax; cannot be matched against without a wildcard ..; and struct update syntax will not work.

arn: Option<String>

The test's ARN.

Implementations

impl GetTestInput

pub fn arn(&self) -> Option<&str>

The test's ARN.

impl GetTestInput

pub fn builder() -> GetTestInputBuilder

Creates a new builder-style object to manufacture GetTestInput.

Trait Implementations

impl Clone for GetTestInput

fn clone(&self) -> GetTestInput

Returns a copy of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for GetTestInput

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl PartialEq for GetTestInput

fn eq(&self, other: &GetTestInput) -> bool

This method tests for self and other values to be equal, and is used by ==.

fn ne(&self, other: &Rhs) -> bool

This method tests for !=. The default implementation is almost always sufficient, and should not be overridden without very good reason.

impl StructuralPartialEq for GetTestInput