pub struct DepylerPatternStats {
pub file_io_count: usize,
pub json_dict_count: usize,
pub context_manager_count: usize,
pub total_count: usize,
}Expand description
Statistics about generated depyler patterns
Fields§
§file_io_count: usizeNumber of file I/O patterns
json_dict_count: usizeNumber of JSON/dict patterns
context_manager_count: usizeNumber of context manager patterns
total_count: usizeTotal pattern count
Trait Implementations§
Source§impl Clone for DepylerPatternStats
impl Clone for DepylerPatternStats
Source§fn clone(&self) -> DepylerPatternStats
fn clone(&self) -> DepylerPatternStats
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreAuto Trait Implementations§
impl Freeze for DepylerPatternStats
impl RefUnwindSafe for DepylerPatternStats
impl Send for DepylerPatternStats
impl Sync for DepylerPatternStats
impl Unpin for DepylerPatternStats
impl UnsafeUnpin for DepylerPatternStats
impl UnwindSafe for DepylerPatternStats
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
Source§impl<T> CloneToUninit for Twhere
T: Clone,
impl<T> CloneToUninit for Twhere
T: Clone,
Source§impl<T> IntoEither for T
impl<T> IntoEither for T
Source§fn into_either(self, into_left: bool) -> Either<Self, Self>
fn into_either(self, into_left: bool) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left is true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read moreSource§fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
fn into_either_with<F>(self, into_left: F) -> Either<Self, Self>
Converts
self into a Left variant of Either<Self, Self>
if into_left(&self) returns true.
Converts self into a Right variant of Either<Self, Self>
otherwise. Read more