pub struct W(_);
Expand description
Register IFCR
writer
Implementations
sourceimpl W
impl W
sourcepub fn cteif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTEIF_A, BitM, 0>
pub fn cteif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTEIF_A, BitM, 0>
Bit 0 - Clear Transfer error interrupt flag Programming this bit to 1 clears the TEIF flag in the DMA2D_ISR register
sourcepub fn ctcif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTCIF_A, BitM, 1>
pub fn ctcif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTCIF_A, BitM, 1>
Bit 1 - Clear transfer complete interrupt flag Programming this bit to 1 clears the TCIF flag in the DMA2D_ISR register
sourcepub fn ctwif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTWIF_A, BitM, 2>
pub fn ctwif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CTWIF_A, BitM, 2>
Bit 2 - Clear transfer watermark interrupt flag Programming this bit to 1 clears the TWIF flag in the DMA2D_ISR register
sourcepub fn caecif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CAECIF_A, BitM, 3>
pub fn caecif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CAECIF_A, BitM, 3>
Bit 3 - Clear CLUT access error interrupt flag Programming this bit to 1 clears the CAEIF flag in the DMA2D_ISR register
sourcepub fn cctcif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CCTCIF_A, BitM, 4>
pub fn cctcif(&mut self) -> BitWriterRaw<'_, u32, IFCR_SPEC, CCTCIF_A, BitM, 4>
Bit 4 - Clear CLUT transfer complete interrupt flag Programming this bit to 1 clears the CTCIF flag in the DMA2D_ISR register
Methods from Deref<Target = W<IFCR_SPEC>>
sourcepub unsafe fn bits(&mut self, bits: <REG as RegisterSpec>::Ux) -> &mut W<REG>
pub unsafe fn bits(&mut self, bits: <REG as RegisterSpec>::Ux) -> &mut W<REG>
Writes raw bits to the register.
Trait Implementations
Auto Trait Implementations
Blanket Implementations
sourceimpl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
const: unstable · sourcefn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more