Expand description
Description cluster[n]: Input configuration for CH[n]
Structs
Description cluster[n]: Input configuration for CH[n]
Register
CONFIG
readerRegister
CONFIG
writerEnums
Enable burst mode
Gain control
Enable differential mode
Reference control
Negative channel resistor control
Positive channel resistor control
Acquisition time, the time the SAADC uses to sample the input voltage
Type Definitions
Field
BURST
reader - Enable burst modeField
BURST
writer - Enable burst modeField
GAIN
reader - Gain controlField
GAIN
writer - Gain controlField
MODE
reader - Enable differential modeField
MODE
writer - Enable differential modeField
REFSEL
reader - Reference controlField
REFSEL
writer - Reference controlField
RESN
reader - Negative channel resistor controlField
RESN
writer - Negative channel resistor controlField
RESP
reader - Positive channel resistor controlField
RESP
writer - Positive channel resistor controlField
TACQ
reader - Acquisition time, the time the SAADC uses to sample the input voltageField
TACQ
writer - Acquisition time, the time the SAADC uses to sample the input voltage