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#[doc = "Register `MEM_TEST_CONF` reader"]
pub struct R(crate::R<MEM_TEST_CONF_SPEC>);
impl core::ops::Deref for R {
    type Target = crate::R<MEM_TEST_CONF_SPEC>;
    #[inline(always)]
    fn deref(&self) -> &Self::Target {
        &self.0
    }
}
impl From<crate::R<MEM_TEST_CONF_SPEC>> for R {
    #[inline(always)]
    fn from(reader: crate::R<MEM_TEST_CONF_SPEC>) -> Self {
        R(reader)
    }
}
#[doc = "Register `MEM_TEST_CONF` writer"]
pub struct W(crate::W<MEM_TEST_CONF_SPEC>);
impl core::ops::Deref for W {
    type Target = crate::W<MEM_TEST_CONF_SPEC>;
    #[inline(always)]
    fn deref(&self) -> &Self::Target {
        &self.0
    }
}
impl core::ops::DerefMut for W {
    #[inline(always)]
    fn deref_mut(&mut self) -> &mut Self::Target {
        &mut self.0
    }
}
impl From<crate::W<MEM_TEST_CONF_SPEC>> for W {
    #[inline(always)]
    fn from(writer: crate::W<MEM_TEST_CONF_SPEC>) -> Self {
        W(writer)
    }
}
#[doc = "Field `HP_MEM_WPULSE` reader - This field controls hp system memory WPULSE parameter. 0b000 for 1.1V/1.0V/0.9V operating Voltage."]
pub type HP_MEM_WPULSE_R = crate::FieldReader;
#[doc = "Field `HP_MEM_WPULSE` writer - This field controls hp system memory WPULSE parameter. 0b000 for 1.1V/1.0V/0.9V operating Voltage."]
pub type HP_MEM_WPULSE_W<'a, const O: u8> = crate::FieldWriter<'a, MEM_TEST_CONF_SPEC, 3, O>;
#[doc = "Field `HP_MEM_WA` reader - This field controls hp system memory WA parameter. 0b100 for 1.1V operating Voltage, 0b101 for 1.0V, 0b110 for 0.9V."]
pub type HP_MEM_WA_R = crate::FieldReader;
#[doc = "Field `HP_MEM_WA` writer - This field controls hp system memory WA parameter. 0b100 for 1.1V operating Voltage, 0b101 for 1.0V, 0b110 for 0.9V."]
pub type HP_MEM_WA_W<'a, const O: u8> = crate::FieldWriter<'a, MEM_TEST_CONF_SPEC, 3, O>;
#[doc = "Field `HP_MEM_RA` reader - This field controls hp system memory RA parameter. 0b00 for 1.1V/1.0V operating Voltage, 0b01 for 0.9V."]
pub type HP_MEM_RA_R = crate::FieldReader;
#[doc = "Field `HP_MEM_RA` writer - This field controls hp system memory RA parameter. 0b00 for 1.1V/1.0V operating Voltage, 0b01 for 0.9V."]
pub type HP_MEM_RA_W<'a, const O: u8> = crate::FieldWriter<'a, MEM_TEST_CONF_SPEC, 2, O>;
#[doc = "Field `HP_MEM_RM` reader - This field controls hp system memory RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0000 for 0.9V."]
pub type HP_MEM_RM_R = crate::FieldReader;
#[doc = "Field `HP_MEM_RM` writer - This field controls hp system memory RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0000 for 0.9V."]
pub type HP_MEM_RM_W<'a, const O: u8> = crate::FieldWriter<'a, MEM_TEST_CONF_SPEC, 4, O>;
#[doc = "Field `ROM_RM` reader - This field controls rom RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0010(default) or 0b0001(slow) for 0.9V."]
pub type ROM_RM_R = crate::FieldReader;
#[doc = "Field `ROM_RM` writer - This field controls rom RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0010(default) or 0b0001(slow) for 0.9V."]
pub type ROM_RM_W<'a, const O: u8> = crate::FieldWriter<'a, MEM_TEST_CONF_SPEC, 4, O>;
impl R {
    #[doc = "Bits 0:2 - This field controls hp system memory WPULSE parameter. 0b000 for 1.1V/1.0V/0.9V operating Voltage."]
    #[inline(always)]
    pub fn hp_mem_wpulse(&self) -> HP_MEM_WPULSE_R {
        HP_MEM_WPULSE_R::new((self.bits & 7) as u8)
    }
    #[doc = "Bits 3:5 - This field controls hp system memory WA parameter. 0b100 for 1.1V operating Voltage, 0b101 for 1.0V, 0b110 for 0.9V."]
    #[inline(always)]
    pub fn hp_mem_wa(&self) -> HP_MEM_WA_R {
        HP_MEM_WA_R::new(((self.bits >> 3) & 7) as u8)
    }
    #[doc = "Bits 6:7 - This field controls hp system memory RA parameter. 0b00 for 1.1V/1.0V operating Voltage, 0b01 for 0.9V."]
    #[inline(always)]
    pub fn hp_mem_ra(&self) -> HP_MEM_RA_R {
        HP_MEM_RA_R::new(((self.bits >> 6) & 3) as u8)
    }
    #[doc = "Bits 8:11 - This field controls hp system memory RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0000 for 0.9V."]
    #[inline(always)]
    pub fn hp_mem_rm(&self) -> HP_MEM_RM_R {
        HP_MEM_RM_R::new(((self.bits >> 8) & 0x0f) as u8)
    }
    #[doc = "Bits 12:15 - This field controls rom RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0010(default) or 0b0001(slow) for 0.9V."]
    #[inline(always)]
    pub fn rom_rm(&self) -> ROM_RM_R {
        ROM_RM_R::new(((self.bits >> 12) & 0x0f) as u8)
    }
}
#[cfg(feature = "impl-register-debug")]
impl core::fmt::Debug for R {
    fn fmt(&self, f: &mut core::fmt::Formatter) -> core::fmt::Result {
        f.debug_struct("MEM_TEST_CONF")
            .field(
                "hp_mem_wpulse",
                &format_args!("{}", self.hp_mem_wpulse().bits()),
            )
            .field("hp_mem_wa", &format_args!("{}", self.hp_mem_wa().bits()))
            .field("hp_mem_ra", &format_args!("{}", self.hp_mem_ra().bits()))
            .field("hp_mem_rm", &format_args!("{}", self.hp_mem_rm().bits()))
            .field("rom_rm", &format_args!("{}", self.rom_rm().bits()))
            .finish()
    }
}
#[cfg(feature = "impl-register-debug")]
impl core::fmt::Debug for crate::generic::Reg<MEM_TEST_CONF_SPEC> {
    fn fmt(&self, f: &mut core::fmt::Formatter<'_>) -> core::fmt::Result {
        self.read().fmt(f)
    }
}
impl W {
    #[doc = "Bits 0:2 - This field controls hp system memory WPULSE parameter. 0b000 for 1.1V/1.0V/0.9V operating Voltage."]
    #[inline(always)]
    #[must_use]
    pub fn hp_mem_wpulse(&mut self) -> HP_MEM_WPULSE_W<0> {
        HP_MEM_WPULSE_W::new(self)
    }
    #[doc = "Bits 3:5 - This field controls hp system memory WA parameter. 0b100 for 1.1V operating Voltage, 0b101 for 1.0V, 0b110 for 0.9V."]
    #[inline(always)]
    #[must_use]
    pub fn hp_mem_wa(&mut self) -> HP_MEM_WA_W<3> {
        HP_MEM_WA_W::new(self)
    }
    #[doc = "Bits 6:7 - This field controls hp system memory RA parameter. 0b00 for 1.1V/1.0V operating Voltage, 0b01 for 0.9V."]
    #[inline(always)]
    #[must_use]
    pub fn hp_mem_ra(&mut self) -> HP_MEM_RA_W<6> {
        HP_MEM_RA_W::new(self)
    }
    #[doc = "Bits 8:11 - This field controls hp system memory RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0000 for 0.9V."]
    #[inline(always)]
    #[must_use]
    pub fn hp_mem_rm(&mut self) -> HP_MEM_RM_W<8> {
        HP_MEM_RM_W::new(self)
    }
    #[doc = "Bits 12:15 - This field controls rom RM parameter. 0b0011 for 1.1V operating Voltage, 0b0010 for 1.0V, 0b0010(default) or 0b0001(slow) for 0.9V."]
    #[inline(always)]
    #[must_use]
    pub fn rom_rm(&mut self) -> ROM_RM_W<12> {
        ROM_RM_W::new(self)
    }
    #[doc = "Writes raw bits to the register."]
    #[inline(always)]
    pub unsafe fn bits(&mut self, bits: u32) -> &mut Self {
        self.0.bits(bits);
        self
    }
}
#[doc = "MEM_TEST configuration register\n\nThis register you can [`read`](crate::generic::Reg::read), [`write_with_zero`](crate::generic::Reg::write_with_zero), [`reset`](crate::generic::Reg::reset), [`write`](crate::generic::Reg::write), [`modify`](crate::generic::Reg::modify). See [API](https://docs.rs/svd2rust/#read--modify--write-api).\n\nFor information about available fields see [mem_test_conf](index.html) module"]
pub struct MEM_TEST_CONF_SPEC;
impl crate::RegisterSpec for MEM_TEST_CONF_SPEC {
    type Ux = u32;
}
#[doc = "`read()` method returns [mem_test_conf::R](R) reader structure"]
impl crate::Readable for MEM_TEST_CONF_SPEC {
    type Reader = R;
}
#[doc = "`write(|w| ..)` method takes [mem_test_conf::W](W) writer structure"]
impl crate::Writable for MEM_TEST_CONF_SPEC {
    type Writer = W;
    const ZERO_TO_MODIFY_FIELDS_BITMAP: Self::Ux = 0;
    const ONE_TO_MODIFY_FIELDS_BITMAP: Self::Ux = 0;
}
#[doc = "`reset()` method sets MEM_TEST_CONF to value 0x2228"]
impl crate::Resettable for MEM_TEST_CONF_SPEC {
    const RESET_VALUE: Self::Ux = 0x2228;
}