Module esp32h2::usb_device::test

Registers used for debugging the PHY.

Structs

• R
  Register TEST reader
• TEST_SPEC
  Registers used for debugging the PHY.
• W
  Register TEST writer

Type Definitions

• TEST_ENABLE_R
  Field TEST_ENABLE reader - Enable test of the USB pad
• TEST_ENABLE_W
  Field TEST_ENABLE writer - Enable test of the USB pad
• TEST_RX_DM_R
  Field TEST_RX_DM reader - USB D- rx value in test
• TEST_RX_DP_R
  Field TEST_RX_DP reader - USB D+ rx value in test
• TEST_RX_RCV_R
  Field TEST_RX_RCV reader - USB RCV value in test
• TEST_TX_DM_R
  Field TEST_TX_DM reader - USB D- tx value in test
• TEST_TX_DM_W
  Field TEST_TX_DM writer - USB D- tx value in test
• TEST_TX_DP_R
  Field TEST_TX_DP reader - USB D+ tx value in test
• TEST_TX_DP_W
  Field TEST_TX_DP writer - USB D+ tx value in test
• TEST_USB_OE_R
  Field TEST_USB_OE reader - USB pad oen in test
• TEST_USB_OE_W
  Field TEST_USB_OE writer - USB pad oen in test