Module digital

Available on crate feature eh0 only.

Mock digital InputPin, OutputPin, and ToggleableOutputPin v2 implementations

use std::io::ErrorKind;

use embedded_hal::digital::v2::{InputPin, OutputPin, ToggleableOutputPin};
use embedded_hal_mock::eh0::{
    digital::{Mock as PinMock, State as PinState, Transaction as PinTransaction},
    MockError,
};

let err = MockError::Io(ErrorKind::NotConnected);

// Configure expectations
let expectations = [
    PinTransaction::get(PinState::High),
    PinTransaction::get(PinState::High),
    PinTransaction::set(PinState::Low),
    PinTransaction::set(PinState::High).with_error(err.clone()),
    PinTransaction::toggle(),
];

// Create pin
let mut pin = PinMock::new(&expectations);

// Run and test
assert_eq!(pin.is_high().unwrap(), true);
assert_eq!(pin.is_low().unwrap(), false);

pin.set_low().unwrap();
pin.set_high().expect_err("expected error return");

pin.toggle().unwrap();

pin.done();

// Update expectations
pin.update_expectations(&[]);
// ...
pin.done();

Structs

Transaction

MockPin transaction

Enums

State

Digital pin value enumeration

TransactionKind

MockPin transaction kind.

Type Aliases

Mock

Mock Pin implementation

PwmDuty

The type used for the duty of the PwmPin mock.