Expand description
Scan configuration
Structs§
- CH11_
INTERACT_ SPEC - Scan configuration
- R
- Register
CH11_INTERACT
reader - W
- Register
CH11_INTERACT
writer
Enums§
Type Aliases§
- ACMPTHRES_
R - Field
ACMPTHRES
reader - Set ACMP threshold - ACMPTHRES_
W - Field
ACMPTHRES
writer - Set ACMP threshold - ALTEX_R
- Field
ALTEX
reader - Use alternative excite pin - ALTEX_W
- Field
ALTEX
writer - Use alternative excite pin - EXCLK_R
- Field
EXCLK
reader - Select clock used for excitation timing - EXCLK_W
- Field
EXCLK
writer - Select clock used for excitation timing - EXMODE_
R - Field
EXMODE
reader - Set GPIO mode - EXMODE_
W - Field
EXMODE
writer - Set GPIO mode - SAMPLECLK_
R - Field
SAMPLECLK
reader - Select clock used for timing of sample delay - SAMPLECLK_
W - Field
SAMPLECLK
writer - Select clock used for timing of sample delay - SAMPLE_
R - Field
SAMPLE
reader - Select sample mode - SAMPLE_
W - Field
SAMPLE
writer - Select sample mode - SETIF_R
- Field
SETIF
reader - Enable interrupt generation - SETIF_W
- Field
SETIF
writer - Enable interrupt generation