#[repr(C)]pub struct BindAccelerationStructureMemoryInfoNV {
pub s_type: StructureType,
pub next: *const c_void,
pub acceleration_structure: AccelerationStructureNV,
pub memory: DeviceMemory,
pub memory_offset: DeviceSize,
pub device_index_count: u32,
pub device_indices: *const u32,
}
Expand description
Fields§
§s_type: StructureType
§next: *const c_void
§acceleration_structure: AccelerationStructureNV
§memory: DeviceMemory
§memory_offset: DeviceSize
§device_index_count: u32
§device_indices: *const u32
Trait Implementations§
source§impl Clone for BindAccelerationStructureMemoryInfoNV
impl Clone for BindAccelerationStructureMemoryInfoNV
source§fn clone(&self) -> BindAccelerationStructureMemoryInfoNV
fn clone(&self) -> BindAccelerationStructureMemoryInfoNV
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl PartialEq for BindAccelerationStructureMemoryInfoNV
impl PartialEq for BindAccelerationStructureMemoryInfoNV
source§fn eq(&self, other: &BindAccelerationStructureMemoryInfoNV) -> bool
fn eq(&self, other: &BindAccelerationStructureMemoryInfoNV) -> bool
This method tests for
self
and other
values to be equal, and is used
by ==
.impl Copy for BindAccelerationStructureMemoryInfoNV
impl Eq for BindAccelerationStructureMemoryInfoNV
impl StructuralPartialEq for BindAccelerationStructureMemoryInfoNV
Auto Trait Implementations§
impl Freeze for BindAccelerationStructureMemoryInfoNV
impl RefUnwindSafe for BindAccelerationStructureMemoryInfoNV
impl !Send for BindAccelerationStructureMemoryInfoNV
impl !Sync for BindAccelerationStructureMemoryInfoNV
impl Unpin for BindAccelerationStructureMemoryInfoNV
impl UnwindSafe for BindAccelerationStructureMemoryInfoNV
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more