#[repr(C)]pub struct DescriptorSetVariableDescriptorCountAllocateInfo {
pub s_type: StructureType,
pub next: *const c_void,
pub descriptor_set_count: u32,
pub descriptor_counts: *const u32,
}
Expand description
Fields§
§s_type: StructureType
§next: *const c_void
§descriptor_set_count: u32
§descriptor_counts: *const u32
Trait Implementations§
source§impl Clone for DescriptorSetVariableDescriptorCountAllocateInfo
impl Clone for DescriptorSetVariableDescriptorCountAllocateInfo
source§fn clone(&self) -> DescriptorSetVariableDescriptorCountAllocateInfo
fn clone(&self) -> DescriptorSetVariableDescriptorCountAllocateInfo
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl PartialEq for DescriptorSetVariableDescriptorCountAllocateInfo
impl PartialEq for DescriptorSetVariableDescriptorCountAllocateInfo
source§fn eq(&self, other: &DescriptorSetVariableDescriptorCountAllocateInfo) -> bool
fn eq(&self, other: &DescriptorSetVariableDescriptorCountAllocateInfo) -> bool
This method tests for
self
and other
values to be equal, and is used
by ==
.impl Copy for DescriptorSetVariableDescriptorCountAllocateInfo
impl Eq for DescriptorSetVariableDescriptorCountAllocateInfo
impl StructuralPartialEq for DescriptorSetVariableDescriptorCountAllocateInfo
Auto Trait Implementations§
impl Freeze for DescriptorSetVariableDescriptorCountAllocateInfo
impl RefUnwindSafe for DescriptorSetVariableDescriptorCountAllocateInfo
impl !Send for DescriptorSetVariableDescriptorCountAllocateInfo
impl !Sync for DescriptorSetVariableDescriptorCountAllocateInfo
impl Unpin for DescriptorSetVariableDescriptorCountAllocateInfo
impl UnwindSafe for DescriptorSetVariableDescriptorCountAllocateInfo
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more