Fields
channel: u8
voltage: i32
Trait Implementations
sourceimpl Clone for VoltageReachedEvent
impl Clone for VoltageReachedEvent
sourcefn clone(&self) -> VoltageReachedEvent
fn clone(&self) -> VoltageReachedEvent
Returns a copy of the value. Read more
1.0.0 · sourcefn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresourceimpl Debug for VoltageReachedEvent
impl Debug for VoltageReachedEvent
sourceimpl Default for VoltageReachedEvent
impl Default for VoltageReachedEvent
sourcefn default() -> VoltageReachedEvent
fn default() -> VoltageReachedEvent
Returns the “default value” for a type. Read more
sourceimpl FromByteSlice for VoltageReachedEvent
impl FromByteSlice for VoltageReachedEvent
sourcefn bytes_expected() -> usize
fn bytes_expected() -> usize
Returns how many bytes are expected to deserialize a instance of the implementing type. Currently this method is only used for strings.
sourcefn from_le_bytes(bytes: &[u8]) -> VoltageReachedEvent
fn from_le_bytes(bytes: &[u8]) -> VoltageReachedEvent
Deserialize the implementing type from a byte slice.
sourceimpl Hash for VoltageReachedEvent
impl Hash for VoltageReachedEvent
sourceimpl PartialEq<VoltageReachedEvent> for VoltageReachedEvent
impl PartialEq<VoltageReachedEvent> for VoltageReachedEvent
sourcefn eq(&self, other: &VoltageReachedEvent) -> bool
fn eq(&self, other: &VoltageReachedEvent) -> bool
impl Copy for VoltageReachedEvent
impl Eq for VoltageReachedEvent
impl StructuralEq for VoltageReachedEvent
impl StructuralPartialEq for VoltageReachedEvent
Auto Trait Implementations
impl RefUnwindSafe for VoltageReachedEvent
impl Send for VoltageReachedEvent
impl Sync for VoltageReachedEvent
impl Unpin for VoltageReachedEvent
impl UnwindSafe for VoltageReachedEvent
Blanket Implementations
sourceimpl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
const: unstable · sourcefn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more