Expand description

Description cluster: Input configuration for CH[n]

Structs

Description cluster: Input configuration for CH[n]
Register CONFIG reader
Register CONFIG writer

Enums

Enable burst mode
Gain control
Enable differential mode
Reference control
Negative channel resistor control
Positive channel resistor control
Acquisition time, the time the ADC uses to sample the input voltage

Type Definitions

Field BURST reader - Enable burst mode
Field BURST writer - Enable burst mode
Field GAIN reader - Gain control
Field GAIN writer - Gain control
Field MODE reader - Enable differential mode
Field MODE writer - Enable differential mode
Field REFSEL reader - Reference control
Field REFSEL writer - Reference control
Field RESN reader - Negative channel resistor control
Field RESN writer - Negative channel resistor control
Field RESP reader - Positive channel resistor control
Field RESP writer - Positive channel resistor control
Field TACQ reader - Acquisition time, the time the ADC uses to sample the input voltage
Field TACQ writer - Acquisition time, the time the ADC uses to sample the input voltage