Module nrf52810_hal::pac::saadc::ch::config

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Expand description

Description cluster: Input configuration for CH[n]

Structs§

  • Description cluster: Input configuration for CH[n]
  • Register CONFIG reader
  • Register CONFIG writer

Enums§

  • Enable burst mode
  • Gain control
  • Enable differential mode
  • Reference control
  • Negative channel resistor control
  • Positive channel resistor control
  • Acquisition time, the time the ADC uses to sample the input voltage

Type Aliases§

  • Field BURST reader - Enable burst mode
  • Field BURST writer - Enable burst mode
  • Field GAIN reader - Gain control
  • Field GAIN writer - Gain control
  • Field MODE reader - Enable differential mode
  • Field MODE writer - Enable differential mode
  • Field REFSEL reader - Reference control
  • Field REFSEL writer - Reference control
  • Field RESN reader - Negative channel resistor control
  • Field RESN writer - Negative channel resistor control
  • Field RESP reader - Positive channel resistor control
  • Field RESP writer - Positive channel resistor control
  • Field TACQ reader - Acquisition time, the time the ADC uses to sample the input voltage
  • Field TACQ writer - Acquisition time, the time the ADC uses to sample the input voltage